ION-BEAM MODIFICATION OF SIC CRYSTALS AND FIBERS

被引:0
作者
SPITZNAGEL, JA
CHOYKE, WJ
GREGGI, J
FISHMAN, SG
机构
[1] WESTINGHOUSE ELECT CORP,CTR RES & DEV,PITTSBURGH,PA 15235
[2] UNIV PITTSBURGH,PITTSBURGH,PA 15260
[3] USN,OFF NAVAL RES,ARLINGTON,VA 22203
来源
JOURNAL OF METALS | 1985年 / 37卷 / 08期
关键词
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:A35 / A35
页数:1
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[41]   ION-BEAM MODIFICATION OF MOSX FILMS ON METALS [J].
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[45]   Epitaxial growth of β-SiC on ion-beam synthesized β-SiC:: Structural characterization [J].
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Pérez-Rodríguez, A ;
Serre, C ;
Morante, JR ;
Esteve, J ;
Acero, MC ;
Kögler, R ;
Skorupa, W ;
Östling, M ;
Nordell, N ;
Karlsson, S ;
Van Landuyt, J .
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 :309-312
[46]   Epitaxial growth of β-SiC on ion-beam synthesized β-SiC: Structural characterization [J].
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Kögler, R. ;
Skorupa, W. ;
Östling, M. ;
Nordell, N. ;
Karlsson, S. ;
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[47]   SURFACE MODIFICATION BY ION-IMPLANTATION AND ION-BEAM MIXING [J].
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[48]   Ion-beam induced damage and annealing behaviour in SiC [J].
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Heft, A. ;
Wesch, W. .
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1998, 141 (1-4) :105-117
[49]   Ion-beam modification of ISFET membranes for copper ion detection [J].
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[50]   ION-BEAM INDUCED ATOMIC MIXING IN TI/SIC [J].
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