DEVELOPMENT OF OPTICAL MONITOR FOR CONTROL OF THIN-FILM DEPOSITION

被引:7
作者
POWELL, I
ZWINKELS, JCM
ROBERTSON, AR
机构
来源
APPLIED OPTICS | 1986年 / 25卷 / 20期
关键词
D O I
10.1364/AO.25.003645
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
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页码:3645 / 3652
页数:8
相关论文
共 10 条
[1]   ASSESSMENT OF COLOR-MEASURING INSTRUMENTS [J].
BILLMEYER, FW ;
ALESSI, PJ .
COLOR RESEARCH AND APPLICATION, 1981, 6 (04) :195-202
[2]  
JONES DG, 1985, ANAL CHEM, V57, P1057
[3]   MONITORING OF OPTICAL COATINGS [J].
MACLEOD, HA .
APPLIED OPTICS, 1981, 20 (01) :82-89
[4]   DIODE-ARRAY SPECTROMETER - AN OPTIMIZED DESIGN [J].
SCHLEMMER, HH ;
MACHLER, M .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1985, 18 (11) :914-919
[5]  
SMITH WJ, 1966, MODERN OPTICAL ENG, P42
[6]   DIFFRACTION ANOMALIES IN GRATING SPECTROPHOTOMETERS [J].
STEWART, JE ;
GALLAWAY, WS .
APPLIED OPTICS, 1962, 1 (04) :421-429
[7]   SELF-SCANNED PHOTO-DIODE ARRAY - A MULTICHANNEL SPECTROMETRIC DETECTOR [J].
TALMI, Y ;
SIMPSON, RW .
APPLIED OPTICS, 1980, 19 (09) :1401-1414
[8]   WIDEBAND OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS [J].
VIDAL, B ;
FORNIER, A ;
PELLETIER, E .
APPLIED OPTICS, 1979, 18 (22) :3851-3856
[9]   OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS [J].
VIDAL, B ;
FORNIER, A ;
PELLETIER, E .
APPLIED OPTICS, 1978, 17 (07) :1038-1047
[10]  
1976, DATA SHEET EG G RETI