DIRECT ELECTRON-SPIN-RESONANCE DETERMINATION OF DANGLING BOND-ENERGIES IN RF-SPUTTERED HYDROGENATED AMORPHOUS-SILICON

被引：9

作者：

JOUSSE, D

机构：

来源：

APPLIED PHYSICS LETTERS | 1986年 / 49卷 / 21期

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D O I：

10.1063/1.97347

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：1438 / 1440

页数：3

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