NONALLOYED AND ALLOYED LOW-RESISTANCE OHMIC CONTACTS WITH GOOD MORPHOLOGY FOR GAAS USING A GRADED INGAAS CAP LAYER

被引:15
作者
MEHDI, I
REDDY, UK
OH, J
EAST, JR
HADDAD, GI
机构
关键词
D O I
10.1063/1.343080
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:867 / 869
页数:3
相关论文
共 6 条
[1]   MODELS FOR CONTACTS TO PLANAR DEVICES [J].
BERGER, HH .
SOLID-STATE ELECTRONICS, 1972, 15 (02) :145-&
[2]   OHMIC CONTACTS TO GAAS [J].
BRASLAU, N .
THIN SOLID FILMS, 1983, 104 (3-4) :391-397
[3]   ERRORS IN REGISTRATION MARK DETECTION FOR ELECTRON LITHOGRAPHY [J].
ERASMUS, SJ ;
HOLLEY, G .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (03) :871-875
[4]   EXPERIMENTAL SCANNING ELECTRON-BEAM AUTOMATIC REGISTRATION SYSTEM [J].
WILSON, AD ;
CHANG, THP ;
KERN, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1240-1245
[5]   OHMIC CONTACTS TO NORMAL-GAAS USING GRADED BAND-GAP LAYERS OF GA1-XINXAS GROWN BY MOLECULAR-BEAM EPITAXY [J].
WOODALL, JM ;
FREEOUF, JL ;
PETTIT, GD ;
JACKSON, TN ;
KIRCHNER, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :626-627
[6]  
WRIGHT SL, 1986, APPL PHYS LETT, V49, P1