ELECTRONIC STOPPING POWER MEASUREMENTS USING SECONDARY-ION BEAMS

被引:0
|
作者
NATH, N
DAHINWAL, OP
BHAGWAT, A
AVASTHI, DK
HARIKUMAR, V
PATHAK, AP
机构
[1] NUCL SCI CTR,POB 10502,NEW DELHI 110067,INDIA
[2] KURUKSHETRA UNIV,KURUKSHETRA 132119,HARYANA,INDIA
[3] CENT UNIV,SCH PHYS,HYDERABAD 560114,INDIA
来源
SURFACE & COATINGS TECHNOLOGY | 1994年 / 66卷 / 1-3期
关键词
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Stopping powers for O and Ti ions were measured in a mylar foil 2 mum thick. The choice of the foil was made because of its wide application in elastic recoil detection analysis experiments and thin windows for gaseous detectors. As a new approach, recoil ions produced in heavy ion scattering were utilized for (dE/dx) measurements. The energy loss of the recoil ions was measured by keeping two surface barrier detectors, with and without the mylar foil, at the same recoil angle, with their gains matched with pulsers before the experiment. Different energies of the secondary beam could be selected by changing the detection angle. Also, various species of secondary ions could be obtained by merely changing the target. We demonstrate here our new technique and some of the results obtained.
引用
收藏
页码:231 / 234
页数:4
相关论文
共 50 条
  • [1] SECONDARY-ION MASS-SPECTROMETRY OF PARTICLE BEAMS
    SANDERS, PE
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 1990, 4 (04) : 123 - 124
  • [2] Improved depthwise resolution in secondary-ion mass spectrometry using proton beams
    Vasil'ev, MA
    Makeeva, IN
    INDUSTRIAL LABORATORY, 1999, 64 (09): : 576 - 578
  • [3] Effect of the local electronic temperature on secondary-ion spectra
    Klushin, DV
    Gusev, MY
    Lysenko, SA
    Urazgildin, IF
    PHYSICAL REVIEW B, 1996, 54 (10) : 7062 - 7066
  • [4] A TIME-OF-FLIGHT METHOD FOR STOPPING POWER MEASUREMENTS OF BUNCHED ION-BEAMS
    GEISSEL, H
    LAICHTER, Y
    ALBRECHT, R
    KITAHARA, T
    KLABUNDE, J
    STREHL, P
    ARMBRUSTER, P
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 206 (03): : 609 - 612
  • [5] Electronic stopping power of hydrogen beams traversing oxygen
    Olivera, GH
    Martinez, AE
    Rivarola, RD
    Fainstein, PD
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 111 (1-2): : 7 - 11
  • [6] Atomic collisions in secondary ion production by hydrogen near the electronic stopping power maximum
    Neugebauer, R
    Pereira, JAM
    Wünsch, R
    Jalowy, T
    Groeneveld, KO
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 154 (1-4): : 325 - 329
  • [7] Atomic collisions in secondary ion production by hydrogen near the electronic stopping power maximum
    Inst. F. Kernphysik Johann W., August-Euler-Str. 6, D-60486, Frankfurt am Main, Germany
    不详
    Nucl Instrum Methods Phys Res Sect B, 1-4 (325-329):
  • [8] MeV heavy ion stopping power measurements using NSC Pelletron
    Kumar, S
    Sharma, SK
    Nath, N
    Kumar, VH
    Pathak, AP
    Hui, SK
    Kabiraj, D
    Avasthi, DK
    VACUUM, 1997, 48 (12) : 1027 - 1029
  • [9] Effects of electronic stopping power on fast-ion-induced secondary ion emission from methanol microdroplets
    Kitajima, Kensei
    Tsuchida, Hidetsugu
    Majima, Takuya
    Saito, Manabu
    EUROPEAN PHYSICAL JOURNAL D, 2018, 72 (10):
  • [10] Effects of electronic stopping power on fast-ion-induced secondary ion emission from methanol microdroplets
    Kensei Kitajima
    Hidetsugu Tsuchida
    Takuya Majima
    Manabu Saito
    The European Physical Journal D, 2018, 72