PROBLEMS OF YIELD GRADIENT ESTIMATION FOR TRUNCATED PROBABILITY DENSITY-FUNCTIONS

被引:7
作者
STYBLINSKI, MA
机构
关键词
D O I
10.1109/TCAD.1986.1270175
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:30 / 38
页数:9
相关论文
共 17 条
[1]   DESIGN CENTERING BY YIELD PREDICTION [J].
ANTREICH, KJ ;
KOBLITZ, RK .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1982, 29 (02) :88-96
[2]  
ELIAS NJ, 1975, P ISCAS 75 BOSTON
[3]  
ILLIN WN, 1972, ENERGIA
[4]   STOCHASTIC ESTIMATION OF THE MAXIMUM OF A REGRESSION FUNCTION [J].
KIEFER, J ;
WOLFOWITZ, J .
ANNALS OF MATHEMATICAL STATISTICS, 1952, 23 (03) :462-466
[5]   STOCHASTIC OPTIMIZATION IN SYSTEM-DESIGN [J].
KJELLSTROM, G ;
TAXEN, L .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1981, 28 (07) :702-715
[6]  
Kushner H. J., 1978, STOCHASTIC APPROXIMA
[7]  
LEUNG KH, 1975, IEEE T CIRCUITS OCT, P796
[8]  
Robins H., 1951, ANN MATH STAT, V22, P400
[9]   STATISTICAL DESIGN CENTERING AND TOLERANCING USING PARAMETRIC SAMPLING [J].
SINGHAL, K ;
PINEL, JF .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1981, 28 (07) :692-702
[10]  
Soin R. S., 1980, IEE Proceedings G (Electronic Circuits and Systems), V127, P260, DOI 10.1049/ip-g-1.1980.0045