TUNNELING TIME AND OFFSET CHARGING IN SMALL TUNNEL-JUNCTIONS

被引：39
|
作者：
GEERLIGS, LJ
ANDEREGG, VF
MOOIJ, JE
机构：
[1] Department of Applied Physics, Delft University of Technology, Delft, 2600 GA
来源：
PHYSICA B | 1990年 / 165卷
关键词：
D O I：
10.1016/S0921-4526(09)80072-0
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Measurements of single electron charging effects in serially coupled tunnel junctions are presented. The results show that the tunneling time is much longer than the barrier traversal time. We find evidence for the presence of offset charging of the junctions. © 1990, Elsevier Science Publishers B.V. (North-Holland). All rights reserved.
引用
收藏
页码：973 / 974
页数：2
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