ANALYSIS AND SCALING OF KELVIN RESISTORS FOR EXTRACTION OF SPECIFIC CONTACT RESISTIVITY

被引：55

作者：

LOH, WM

SARASWAT, K

DUTTON, RW

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 03期

关键词：

D O I：

10.1109/EDL.1985.26061

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：105 / 108

页数：4

相关论文

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