PARAMETRIC EFFECTS ON THE VOID FRACTION MEASUREMENT BY CAPACITANCE TRANSDUCERS

被引：0
|
作者：
CHUN, MH [1 ]
SUNG, CK [1 ]
机构：
[1] KOREA ADV INST SCI & TECHNOL, SEOUL 131, SOUTH KOREA
来源：
TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY | 1984年 / 47卷
关键词：
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：521 / 522
页数：2
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