ANNEALING PROCEDURE FOR SELF-SCANNED DIODE-ARRAYS

被引：4
作者：
GORDON, RL [1 ]
机构：
[1] BATTELLE MEM INST, PACIFIC NW LABS,RICHLAND,WA 99352
来源：
APPLIED OPTICS | 1976年 / 15卷 / 08期
关键词：
D O I：
10.1364/AO.15.001909
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1909 / 1911
页数：3
相关论文
共 6 条
  • [1] CHOISSER JP, 1976, COMMUNICATION JAN
  • [2] FRY PW, 1975, J PHYS E SCI INSTRUM, V8, P337, DOI 10.1088/0022-3735/8/5/001
  • [3] Giffin C. E., 1974, International Journal of Mass Spectrometry and Ion Physics, V15, P437, DOI 10.1016/0020-7381(74)80041-0
  • [4] EFFECTS OF IONIZING RADIATION ON OXIDIZED SILICON SURFACES AND PLANAR DEVICES
    SNOW, EH
    GROVE, AS
    FITZGERALD, DJ
    [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (07): : 1168 - +
  • [5] SELF-SCANNED DIGICON - DIGITAL IMAGE TUBE FOR ASTRONOMICAL SPECTROSCOPY
    TULL, RG
    CHOISSER, JP
    SNOW, EH
    [J]. APPLIED OPTICS, 1975, 14 (05): : 1182 - 1189
  • [6] 101 RET CORP APPL NO
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