A STUDY OF ALNICO MAGNETS BY ATOM PROBE FIELD-ION MICROSCOPY

被引：23

作者：

ZHU, F ^{[1
]}

VONALVENSLEBEN, L ^{[1
]}

HAASEN, P ^{[1
]}

机构：

[1] SONDERFORSCHUNGSBEREICH 126,GOTTINGEN,FED REP GER

来源：

SCRIPTA METALLURGICA | 1984年 / 18卷 / 04期

关键词：

D O I：

10.1016/0036-9748(84)90448-4

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：337 / 342

页数：6

共 50 条

[1] ATOM-PROBE FIELD-ION MICROSCOPY
MULLER, EW
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01): : 89 - &
[2] ATOM-PROBE FIELD-ION MICROSCOPY
LEISCH, M
MIKROCHIMICA ACTA, 1992, 107 (3-6) : 95 - 104
[3] ATOM-PROBE FIELD-ION MICROSCOPY
MILLER, MK
VACUUM, 1994, 45 (6-7) : 819 - 831
[4] Atom probe field-ion microscopy applications
Camus, Patrick P.
High temperature science, 1988, 26 (pt 1): : 131 - 142
[5] ATOM PROBE FIELD-ION MICROSCOPY APPLICATIONS
CAMUS, PP
HIGH TEMPERATURE SCIENCE, 1989, 26 : 131 - 142
[6] ATOM-PROBE FIELD-ION MICROSCOPY
TSONG, TT
PHYSICS TODAY, 1993, 46 (05) : 24 - 31
[7] The development of atom probe field-ion microscopy
Miller, MK
MATERIALS CHARACTERIZATION, 2000, 44 (1-2) : 11 - 27
[8] FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
GODFREY, TJ
SETNA, RP
SMITH, GDW
JOURNAL DE PHYSIQUE, 1989, 50 (C8): : C8381 - C8385
[9] ATOM PROBE FIELD-ION MICROSCOPY OF A FENIB GLASS
PILLER, J
HAASEN, P
ACTA METALLURGICA, 1982, 30 (01): : 1 - 8
[10] FIELD-ION MICROSCOPY AND ATOM PROBE IN MATERIALS SCIENCE
BLAVETTE, D
MENAND, A
ANNALES DE CHIMIE-SCIENCE DES MATERIAUX, 1986, 11 (05): : 321 - 384