RESONANCE IONIZATION MASS-SPECTROMETRY USING A COMMERCIAL ION MICROPROBE MASS ANALYZER

被引：0
作者：
DONOHUE, DL [1 ]
SMITH, DH [1 ]
YOUNG, JP [1 ]
CHRISTIE, WH [1 ]
GOERINGER, DE [1 ]
机构：
[1] OAK RIDGE NATL LAB,DIV ANALYT CHEM,OAK RIDGE,TN 37830
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1984年 / 188卷 / AUG期
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：143 / PHYS
相关论文
共 50 条
  • [41] RESONANCE IONIZATION MASS-SPECTROMETRY OF LEAD AND BISMUTH MIXTURES
    FEAREY, BL
    ANDERSON, JE
    ROWE, MW
    MILLER, CM
    NOGAR, NS
    RESONANCE IONIZATION SPECTROSCOPY 1988, 1989, 94 : 259 - 262
  • [42] ANALYTICAL APPLICATIONS OF RESONANCE IONIZATION MASS-SPECTROMETRY (RIMS)
    FASSETT, JD
    TRAVIS, JC
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1988, 43 (12) : 1409 - 1422
  • [43] ISOTOPIC BIAS EFFECTS IN RESONANCE IONIZATION MASS-SPECTROMETRY
    DONOHUE, DL
    SMITH, DH
    YOUNG, JP
    RAMSEY, JM
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1984, (71): : 83 - 89
  • [44] PRINCIPLE AND ANALYTICAL APPLICATIONS OF RESONANCE IONIZATION MASS-SPECTROMETRY
    RIMKE, H
    HERRMANN, G
    MANG, M
    MUHLECK, C
    RIEGEL, J
    SATTELBERGER, P
    TRAUTMANN, N
    AMES, F
    KLUGE, HJ
    OTTEN, EW
    REHKLAU, D
    RUSTER, W
    SCHEERER, F
    MIKROCHIMICA ACTA, 1989, 3 (3-6) : 223 - 230
  • [45] REMOVAL OF ISOBARIC INTERFERENCES BY RESONANCE IONIZATION MASS-SPECTROMETRY
    DONOHUE, DL
    YOUNG, JP
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 426 : 13 - 17
  • [46] A laser beam analyzer for resonance ionization mass spectrometry studies
    Thattey, SS
    Suri, BM
    Bajaj, PN
    Dev, V
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (01) : 32 - 35
  • [47] IONIZATION CONDITIONS AND ION FORMATION IN ELECTROHYDRODYNAMIC MASS-SPECTROMETRY
    DULCKS, T
    ROLLGEN, FW
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1995, 148 (1-2) : 123 - 144
  • [48] ELECTROSPRAY IONIZATION COMBINED WITH ION TRAP MASS-SPECTROMETRY
    VANBERKEL, GJ
    GLISH, GL
    MCLUCKEY, SA
    ANALYTICAL CHEMISTRY, 1990, 62 (13) : 1284 - 1295
  • [49] CHEMICAL IONIZATION MASS-SPECTROMETRY USING TETRAMETHYLSILANE
    ODIORNE, TJ
    VOUROS, P
    HARVEY, DJ
    JOURNAL OF PHYSICAL CHEMISTRY, 1972, 76 (22) : 3217 - &
  • [50] MATERIALS ANALYSIS BY LASER AND ION-BEAM SPUTTERING WITH RESONANCE IONIZATION MASS-SPECTROMETRY
    NOGAR, NS
    ESTLER, RC
    FEAREY, BL
    MILLER, CM
    DOWNEY, SW
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 44 (04) : 459 - 464
12345