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EXPERIMENTAL TESTS OF NON-THERMAL EFFECT FOR PULSED-LASER ANNEALING BY TIME-RESOLVED REFLECTIVITY AND ELECTRON-PARAMAGNETIC-RES MEASUREMENTS
被引:13
作者
:
MURAKAMI, K
论文数:
0
引用数:
0
h-index:
0
机构:
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
MURAKAMI, K
[
1
]
MASUDA, K
论文数:
0
引用数:
0
h-index:
0
机构:
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
MASUDA, K
[
1
]
AOYAGI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
AOYAGI, Y
[
1
]
NAMBA, S
论文数:
0
引用数:
0
h-index:
0
机构:
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
NAMBA, S
[
1
]
机构
:
[1]
INST PHYS & CHEM RES,WAKO,SAITAMA 351,JAPAN
来源
:
PHYSICA B & C
|
1983年
/ 116卷
/ 1-3期
关键词
:
D O I
:
10.1016/0378-4363(83)90308-X
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:564 / 569
页数:6
相关论文
共 23 条
[21]
NONTHERMAL PULSED LASER ANNEALING OF SI - PLASMA ANNEALING
VANVECHTEN, JA
论文数:
0
引用数:
0
h-index:
0
机构:
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
VANVECHTEN, JA
TSU, R
论文数:
0
引用数:
0
h-index:
0
机构:
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
TSU, R
SARIS, FW
论文数:
0
引用数:
0
h-index:
0
机构:
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
SARIS, FW
[J].
PHYSICS LETTERS A,
1979,
74
(06)
: 422
-
426
[22]
VANVECHTEN JA, 1982, P MRS M LAS EL BEAM, P49
[23]
SCREENING OF HOT-CARRIER RELAXATION IN HIGHLY PHOTO-EXCITED SEMICONDUCTORS
YOFFA, EJ
论文数:
0
引用数:
0
h-index:
0
YOFFA, EJ
[J].
PHYSICAL REVIEW B,
1981,
23
(04)
: 1909
-
1919
←
1
2
3
→
共 23 条
[21]
NONTHERMAL PULSED LASER ANNEALING OF SI - PLASMA ANNEALING
VANVECHTEN, JA
论文数:
0
引用数:
0
h-index:
0
机构:
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
VANVECHTEN, JA
TSU, R
论文数:
0
引用数:
0
h-index:
0
机构:
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
TSU, R
SARIS, FW
论文数:
0
引用数:
0
h-index:
0
机构:
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
SARIS, FW
[J].
PHYSICS LETTERS A,
1979,
74
(06)
: 422
-
426
[22]
VANVECHTEN JA, 1982, P MRS M LAS EL BEAM, P49
[23]
SCREENING OF HOT-CARRIER RELAXATION IN HIGHLY PHOTO-EXCITED SEMICONDUCTORS
YOFFA, EJ
论文数:
0
引用数:
0
h-index:
0
YOFFA, EJ
[J].
PHYSICAL REVIEW B,
1981,
23
(04)
: 1909
-
1919
←
1
2
3
→