SURFACE-ANALYSIS - X-RAY PHOTO-ELECTRON SPECTROSCOPY, AUGER-ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY

被引：39

作者：

TURNER, NH ^{[1
]}

COLTON, RJ ^{[1
]}

机构：

[1] USN, RES LAB, DIV CHEM, WASHINGTON, DC 20375 USA

来源：

ANALYTICAL CHEMISTRY | 1982年 / 54卷 / 05期

关键词：

D O I：

10.1021/ac00242a027

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：R293 / R322

页数：30

共 50 条

[41] CARBONACEOUS OVERLAYER STUDIES ON SOLID-SURFACES BY AUGER AND X-RAY ELECTRON-SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRY
COLTON, RJ
MURDAY, JS
WYATT, JR
DECORPO, JJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1977, 173 (MAR20): : 91 - 91
[42] SURFACE-ANALYSIS OF WOOL BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND STATIC SECONDARY-ION MASS-SPECTROMETRY - REPLY
WARD, RJ
WILLIS, HA
GEORGE, GA
GUISE, GB
DENNING, RJ
EVANS, DJ
SHORT, RD
TEXTILE RESEARCH JOURNAL, 1994, 64 (08) : 493 - 493
[43] APPLICATION OF PROFILING ANALYSIS BY AUGER-ELECTRON SPECTROSCOPY AND OF SECONDARY-ION MASS-SPECTROMETRY TO DETERMINATION OF CHANGES IN SURFACE-LAYER COMPOSITION
SCHNEIDER, H
MIKROCHIMICA ACTA, 1977, 2 (5-6) : 437 - 447
[44] SELECTED AREA X-RAY PHOTO-ELECTRON SPECTROSCOPY
KEAST, DJ
DOWNING, KS
SURFACE AND INTERFACE ANALYSIS, 1981, 3 (02) : 99 - 101
[45] Surface analysis: X-ray photoelectron spectroscopy and auger electron spectroscopy
Turner, NH
Schreifels, JA
ANALYTICAL CHEMISTRY, 2000, 72 (12) : 99R - 110R
[46] Surface analysis: x-ray photoelectron spectroscopy and Auger electron spectroscopy
Anal Chem, 12 (229R):
[47] COMPARISON OF STATIC SECONDARY ION MASS-SPECTROMETRY, ION-SCATTERING SPECTROSCOPY, AND X-RAY PHOTOELECTRON-SPECTROSCOPY FOR SURFACE-ANALYSIS OF ACRYLIC POLYMERS
GARDELLA, JA
HERCULES, DM
ANALYTICAL CHEMISTRY, 1981, 53 (12) : 1879 - 1884
[48] A VERSATILE SPECTROMETER SYSTEM FOR QUANTITATIVE SURFACE AND IN-DEPTH ANALYSIS WITH SECONDARY ION AND SECONDARY NEUTRAL MASS-SPECTROSCOPY, AUGER-ELECTRON AND X-RAY PHOTOELECTRON-SPECTROSCOPY
SANDER, P
ALTEBOCKWINKEL, M
STORM, W
WIEDMANN, L
BENNINGHOVEN, A
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (06): : 3305 - 3311
[49] SURFACE-ANALYSIS BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY OF MOLYBDENUM-DOPED RANEY-NICKEL CATALYSTS
KLEIN, JC
HERCULES, DM
ANALYTICAL CHEMISTRY, 1984, 56 (04) : 685 - 689
[50] ANALYSIS OF THE ANTITARNISH FILM ON A TIN SURFACE BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY
WANG, ZW
WU, NJ
ANALYTICA CHIMICA ACTA, 1990, 238 (02) : 399 - 403

← 1 2 3 4 5 →