SURFACE-ANALYSIS - X-RAY PHOTO-ELECTRON SPECTROSCOPY, AUGER-ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY

被引：39

作者：

TURNER, NH ^{[1
]}

COLTON, RJ ^{[1
]}

机构：

[1] USN, RES LAB, DIV CHEM, WASHINGTON, DC 20375 USA

来源：

ANALYTICAL CHEMISTRY | 1982年 / 54卷 / 05期

关键词：

D O I：

10.1021/ac00242a027

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：R293 / R322

页数：30

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