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- [2] INVESTIGATION OF SILICIDES USING AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTO-ELECTRON SPECTROSCOPYTHIN SOLID FILMS, 1981, 85 (3-4) : 318 - 318ATZRODT, VWIRTH, TLANGE, H
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- [7] SURFACE-ANALYSIS OF TEXTILES AND FIBERS BY X-RAY PHOTO-ELECTRON SPECTROSCOPYABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1981, 182 (AUG): : 25 - INDEMILLARD, MM
- [8] MATERIALS CHARACTERIZATION BY AUGER-ELECTRON SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRYABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1974, : 81 - 81MORABITO, JM
- [9] A COMPARISON OF SECONDARY ION MASS-SPECTROMETRY AND AUGER-ELECTRON SPECTROSCOPY AS SURFACE ANALYTICAL TECHNIQUESNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 401 - 408MORGAN, AE