TIP EFFECTS AND SURFACE MODIFICATION IN SCANNING-TUNNELING-MICROSCOPY

被引：4

作者：

TAYLOR, ME

GOLEN, B

MCKINNON, AW

ROSOLEN, GC

GRAY, SM

WELLAND, ME

机构：

[1] Department of Engineering, University of Cambridge, Cambridge

来源：

APPLIED SURFACE SCIENCE | 1993年 / 67卷 / 1-4期

关键词：

D O I：

10.1016/0169-4332(93)90317-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

In this paper we discuss the effects of tip structure on the behaviour of the scanning tunnelling microscope. The geometry and electronic structure of the tip affect both resolution in imaging and current-voltage spectroscopy. Interactions between tip and sample may lead to modification of the sample. Examples of these effects are drawn from a wide range of systems, including reconstructions on semiconductor surfaces, imaging of nanostructures and low-temperature scanning tunnelling microscopy.

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页码：228 / 234

页数：7

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