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- [2] APPARATUS ELECTRON-BEAM MICROTOMOGRAPHY IN SEM PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 150 (01): : 211 - 219
- [3] USING A SEM FOR ELECTRON-BEAM WRITING JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (01): : 37 - 39
- [4] SCANNING ELECTRON-BEAM ANNEALING WITH A MODIFIED SEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06): : 1843 - 1846
- [5] PROGRESS IN ELECTRON-BEAM TESTING VLSI AND COMPUTER PERIPHERALS: VLSI AND MICROELECTRONIC APPLICATIONS IN INTELLIGENT PERIPHERALS AND THEIR INTERCONNECTION NETWORKS, 1989, : E110 - E115
- [7] SIO2 DAMAGE DURING ELECTRON-BEAM ANNEALING RADIATION PHYSICS AND CHEMISTRY, 1983, 22 (06): : 1050 - 1050