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NOVEL OXIDATION PROCESS IN GE+-IMPLANTED SI AND ITS EFFECT ON OXIDATION-KINETICS
被引:97
作者
:
HOLLAND, OW
论文数:
0
引用数:
0
h-index:
0
HOLLAND, OW
WHITE, CW
论文数:
0
引用数:
0
h-index:
0
WHITE, CW
FATHY, D
论文数:
0
引用数:
0
h-index:
0
FATHY, D
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1987年
/ 51卷
/ 07期
关键词
:
D O I
:
10.1063/1.98385
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:520 / 522
页数:3
相关论文
共 6 条
[1]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
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DEAL, BE
GROVE, AS
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GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[2]
DEAL BE, 1974, J ELECTROCHEM SOC, V121, P1613
[3]
A MASS SPECTROMETRIC METHOD FOR THE DETERMINATION OF DISSOCIATION ENERGIES OF DIATOMIC MOLECULES
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DROWART, J
HONIG, RE
论文数:
0
引用数:
0
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HONIG, RE
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1957,
61
(07)
: 980
-
985
[4]
THERMODYNAMIC STUDY OF SIC UTILIZING A MASS SPECTROMETER
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引用数:
0
h-index:
0
DROWART, J
DEMARIA, G
论文数:
0
引用数:
0
h-index:
0
DEMARIA, G
INGHRAM, MG
论文数:
0
引用数:
0
h-index:
0
INGHRAM, MG
[J].
JOURNAL OF CHEMICAL PHYSICS,
1958,
29
(05)
: 1015
-
1021
[5]
FATHY D, UNPUB
[6]
OXIDATION-ENHANCED OR RETARDED DIFFUSION AND THE GROWTH OR SHRINKAGE OF OXIDATION-INDUCED STACKING-FAULTS IN SILICON
TAN, TY
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GOSELE, U
[J].
APPLIED PHYSICS LETTERS,
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40
(07)
: 616
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←
1
→
共 6 条
[1]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[2]
DEAL BE, 1974, J ELECTROCHEM SOC, V121, P1613
[3]
A MASS SPECTROMETRIC METHOD FOR THE DETERMINATION OF DISSOCIATION ENERGIES OF DIATOMIC MOLECULES
DROWART, J
论文数:
0
引用数:
0
h-index:
0
DROWART, J
HONIG, RE
论文数:
0
引用数:
0
h-index:
0
HONIG, RE
[J].
JOURNAL OF PHYSICAL CHEMISTRY,
1957,
61
(07)
: 980
-
985
[4]
THERMODYNAMIC STUDY OF SIC UTILIZING A MASS SPECTROMETER
DROWART, J
论文数:
0
引用数:
0
h-index:
0
DROWART, J
DEMARIA, G
论文数:
0
引用数:
0
h-index:
0
DEMARIA, G
INGHRAM, MG
论文数:
0
引用数:
0
h-index:
0
INGHRAM, MG
[J].
JOURNAL OF CHEMICAL PHYSICS,
1958,
29
(05)
: 1015
-
1021
[5]
FATHY D, UNPUB
[6]
OXIDATION-ENHANCED OR RETARDED DIFFUSION AND THE GROWTH OR SHRINKAGE OF OXIDATION-INDUCED STACKING-FAULTS IN SILICON
TAN, TY
论文数:
0
引用数:
0
h-index:
0
TAN, TY
GOSELE, U
论文数:
0
引用数:
0
h-index:
0
GOSELE, U
[J].
APPLIED PHYSICS LETTERS,
1982,
40
(07)
: 616
-
619
←
1
→