SPECTROSCOPY OF RADIATION-DAMAGE IN SILICON MIS STRUCTURES

被引：0
作者：
PRIKHODKO, VG
ZHDAN, AG
GALKIN, GN
ABBASOVA, RU
BOBROVA, EA
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SOVIET PHYSICS SEMICONDUCTORS-USSR | 1982年 / 16卷 / 07期
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
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页码：808 / 809
页数：2
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