NANOWIRE ARRAY COMPOSITES

被引:273
作者
HUBER, CA
HUBER, TE
SADOQI, M
LUBIN, JA
MANALIS, S
PRATER, CB
机构
[1] POLYTECH INST NEW YORK,DEPT PHYS,BROOKLYN,NY 11201
[2] HOWARD UNIV,WASHINGTON,DC 20059
[3] DIGITAL INSTRUMENTS,SANTA BARBARA,CA 93103
关键词
D O I
10.1126/science.263.5148.800
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Long, nanometer-size metallic wires can be synthesized by injection of the conducting melt into nanochannel insulating plates. Large-area arrays of parallel wires 200 nanometers in diameter and 50 micrometers long with a packing density of 5 x 10(8) per square centimeter have been fabricated in this way. When charged, the ends of the wires generate strong, short-range electric fields. The nanowire electric fields have been imaged at high spatial resolution with a scanning force microscope.
引用
收藏
页码:800 / 802
页数:3
相关论文
共 16 条
[1]   CAPILLARITY-INDUCED FILLING OF CARBON NANOTUBES [J].
AJAYAN, PM ;
IIJIMA, S .
NATURE, 1993, 361 (6410) :333-334
[2]   MICROSTRUCTURALLY ENGINEERED OPTICALLY TRANSMISSIVE, ELECTRICALLY CONDUCTIVE METAL-FILMS [J].
ASPNES, DE ;
HELLER, A ;
PORTER, JD .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (09) :3028-3034
[3]  
Bogomolov V. N., 1978, Soviet Physics - Uspekhi, V21, P77, DOI 10.1070/PU1978v021n01ABEH005510
[4]  
Borrelli N. F., 1988, Proceedings of the SPIE - The International Society for Optical Engineering, V866, P104
[5]   ANODIC OXIDE FILMS ON ALUMINUM [J].
DIGGLE, JW ;
DOWNIE, TC ;
GOULDING, CW .
CHEMICAL REVIEWS, 1969, 69 (03) :365-&
[6]   THE FORMATION OF CONTROLLED-POROSITY MEMBRANES FROM ANODICALLY OXIDIZED ALUMINUM [J].
FURNEAUX, RC ;
RIGBY, WR ;
DAVIDSON, AP .
NATURE, 1989, 337 (6203) :147-149
[7]   A NOVEL MICROSTRUCTURE - SEMICONDUCTOR-IMPREGNATED POROUS VYCOR GLASS [J].
HUBER, CA ;
HUBER, TE .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (11) :6588-6590
[8]   NONLINEAR OPTICAL-PROPERTIES OF QUANTUM-CONFINED GAAS NANOCRYSTALS IN VYCOR GLASS [J].
JUSTUS, BL ;
TONUCCI, RJ ;
BERRY, AD .
APPLIED PHYSICS LETTERS, 1992, 61 (26) :3151-3153
[9]   HIGH-RESOLUTION CAPACITANCE MEASUREMENT AND POTENTIOMETRY BY FORCE MICROSCOPY [J].
MARTIN, Y ;
ABRAHAM, DW ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1988, 52 (13) :1103-1105
[10]  
ROY R, 1993, MAT RES S C, V286, P241