INELASTIC ELECTRON-SCATTERING FROM ULTRATHIN METALLIC-FILMS ON SI(111)

被引：0
|
作者：
PERSSON, BNJ [1 ]
DEMUTH, JE [1 ]
机构：
[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1986年 / 39卷 / 1-4期
关键词：
D O I：
10.1016/0368-2048(86)85035-6
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：83 / 88
页数：6
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