XPS ANALYSIS OF THIN OXIDE-FILMS ON CHEMICALLY TREATED ALUMINUM-ALLOY SURFACES USING A HIGH-ENERGY MG/ZR ANODE

A method for determining the aluminum oxide and aluminum metal atomic concentrations on complex aluminum alloy surfaces using a high-energy Mg/Zr x-ray source (1253.6 and 2042.4 eV, respectively) was discussed. XPS analysis of chemically processed aluminum surfaces using an Mg or Mg/Al anode limits the analysis of aluminum to the Al 2s and Al 2p photoelectron lines. Analysis of aluminum surfaces using the Al KLL Auger transition and the Mg or Mg/Al x-ray source is accomplished with the bremsstrahlung radiation. The utility of the high-energy Mg/Zr x-ray anode is realized by offering the ability to qualitatively and quantitatively analyze aluminum using the Al KLL Auger region at 1374-1405 eV kinetic energy. The Al KLL Zr excited Auger transition provides a clear separation between the aluminum oxide and metal transitions (6.0 eV).