A THERMAL-DESORPTION INVESTIGATION OF ARSINE CHEMISORPTION ON GA-RICH AND AS-RICH GAAS(100) SURFACES

被引:12
作者
BANSENAUER, BA
CREIGHTON, JR
机构
[1] Organization 1126, Sandia National Laboratories, Albuquerque
关键词
D O I
10.1016/0039-6028(92)90668-V
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have studied the low temperature chemisorption of arsine on the Ga and As-rich surfaces of GaAs(100) using temperature programmed desorption. Arsine desorbing from the "(4 x 6)" Ga-rich surface desorbs from both molecular (T(p) almost-equal-to 165 K) and recombinative states (T(p) = 290 and 380 K) with an estimated saturation coverage of 0.09 ML, where 1 ML = 6.26 x 10(14) atoms/cm2. A very small amount of arsine is irreversibly adsorbed (approximately 0.01 ML) as evidenced by hydrogen desorption at about 520 K. This small arsine coverage suggests that most of the Ga atoms on the Ga-rich surface are not available for arsine chemisorption. On the c(2 x 8)/(2 x 4) As-rich GaAs(100) surface roughly two times more arsine desorbs compared to the Ga-rich surface and new desorption states are seen around 230 and 460 K. This increased arsine coverage suggests that most of the exposed Ga atoms on the As-rich surface are available for chemisorption. Approximately the same amount of arsine irreversibly decomposes on the c(2 x 8)/(2 x 4) As-rich surface (compared to the Ga-rich surface), but H-2 desorption occurs from a broad peak that is centered around 600 K. On the c(4 x 4) As-rich surface, arsine decomposition is not observed and only a small amount of arsine desorption is detected. This result is to be expected since there are no exposed Ga atoms on the c(4 x 4) surface.
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页码:317 / 325
页数:9
相关论文
共 24 条
  • [11] COMPOSITION AND STRUCTURE OF DIFFERENTLY PREPARED GAAS(100) SURFACES STUDIED BY LEED AND AES
    DRATHEN, P
    RANKE, W
    JACOBI, K
    [J]. SURFACE SCIENCE, 1978, 77 (01) : L162 - L166
  • [12] HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDIES OF GAAS (100) SURFACES
    FRANKEL, DJ
    YU, C
    HARBISON, JP
    FARRELL, HH
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04): : 1113 - 1118
  • [13] KUECH TF, 1986, MATER SCI REP, V2, P1
  • [14] SURFACE-STRUCTURE OF AS-STABILIZED GAAS(001) - 2X4,C(2X8), AND DOMAIN-STRUCTURES
    LARSEN, PK
    CHADI, DJ
    [J]. PHYSICAL REVIEW B, 1988, 37 (14): : 8282 - 8288
  • [15] STOICHIOMETRY EFFECTS ON SURFACE-PROPERTIES OF GAAS(100) GROWN INSITU BY MBE
    MASSIES, J
    ETIENNE, P
    DEZALY, F
    LINH, NT
    [J]. SURFACE SCIENCE, 1980, 99 (01) : 121 - 131
  • [16] ADDUCTS IN THE GROWTH OF III-V-COMPOUNDS
    MOSS, RH
    [J]. JOURNAL OF CRYSTAL GROWTH, 1984, 68 (01) : 78 - 87
  • [17] CROSS-SECTIONS OF MOLECULES FOR IONIZATION BY ELECTRONS
    OTVOS, JW
    STEVENSON, DP
    [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1956, 78 (03) : 546 - 551
  • [18] STRUCTURE OF GAAS(001) (2X4)-C(2X8) DETERMINED BY SCANNING TUNNELING MICROSCOPY
    PASHLEY, MD
    HABERERN, KW
    FRIDAY, W
    WOODALL, JM
    KIRCHNER, PD
    [J]. PHYSICAL REVIEW LETTERS, 1988, 60 (21) : 2176 - 2179
  • [19] FRACTIONAL STOICHIOMETRY OF THE GAAS(001)C(4X4) SURFACE - AN INSITU X-RAY-SCATTERING STUDY
    SAUVAGESIMKIN, M
    PINCHAUX, R
    MASSIES, J
    CALVERIE, P
    JEDRECY, N
    BONNET, J
    ROBINSON, IK
    [J]. PHYSICAL REVIEW LETTERS, 1989, 62 (05) : 563 - 566
  • [20] SUMMERS RL, 1969, NASA TND5285 TECHN N