PROBLEMS CONNECTED TO THE TESTING OF DIGITAL INTEGRATED-CIRCUITS

被引：0

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作者：

FANTINI, F

MORANDI, C

SENIN, A

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来源：

ELETTROTECNICA | 1984年 / 71卷 / 05期

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：391 / 403

页数：13

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