PROBLEMS CONNECTED TO THE TESTING OF DIGITAL INTEGRATED-CIRCUITS

被引：0
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作者：
FANTINI, F
MORANDI, C
SENIN, A
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来源：
ELETTROTECNICA | 1984年 / 71卷 / 05期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：391 / 403
页数：13
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