PHASE EVALUATION FOR ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY DEFORMATION ANALYSES

被引：14
|
作者：
YOSHIDA, S
SUPRAPEDI
WIDIASTUTI, R
ASTUTI, ET
KUSNOWO, A
机构：
[1] Research and Development Center for Applied Physics, Indonesian Institute of Sciences, Serpong, Tangerang, 15310, Puspiptek
来源：
OPTICS LETTERS | 1995年 / 20卷 / 07期
关键词：
D O I：
10.1364/OL.20.000755
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new, handy method to evaluate phase data from fringe patterns produced by electronic speckle-pattern interferometry is proposed. The method is capable of evaluating phase data by simply taking speckle images and performing arithmetic operations on them. No extra optics or phase modulation is needed. Experiments have been carried out to prove the validity of the principle and demonstrate the capability of applications to practical deformation analyses.
引用
收藏
页码：755 / 757
页数：3
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