NANOSCALE VISUALIZATION AND CONTROL OF FERROELECTRIC DOMAINS BY ATOMIC-FORCE MICROSCOPY

被引：209
|
作者：
KOLOSOV, O
GRUVERMAN, A
HATANO, J
TAKAHASHI, K
TOKUMOTO, H
机构：
[1] ANGSTROM TECHNOL PARTNERSHIP,JOINT RES CTR ATOM TECHNOL,TSUKUBA,IBARAKI 305,JAPAN
[2] MECH ENGN LAB,TSUKUBA,IBARAKI 305,JAPAN
[3] NATL INST RES INORGAN MAT,TSUKUBA,IBARAKI 305,JAPAN
[4] SCI UNIV TOKYO,DEPT MAT SCI & TECHNOL,NODA,CHIBA 278,JAPAN
来源：
PHYSICAL REVIEW LETTERS | 1995年 / 74卷 / 21期
关键词：
D O I：
10.1103/PhysRevLett.74.4309
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The nanoscale visualization and control of domain structure with atomic force microscopy (AFM) in the ferroelectric crystal guanidinium aluminum sulfate hexahydrate is reported. The origin of the domain contrast in the topographic of AFM images is explained by the piezoelectric deformation of the crystal surface in the internal electric field. The domain structure was modified by applying a voltage to the conductive AFM tip. The dynamics of domain growth has been directly observed for the first time with a resolution of 10 nm. © 1995 The American Physical Society.
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页码：4309 / 4312
页数：4
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