TUNNELING MICROSCOPE FOR OPERATION IN AIR OR FLUIDS

被引：82

作者：

DRAKE, B ^{[1
]}

SONNENFELD, R ^{[1
]}

SCHNEIR, J ^{[1
]}

HANSMA, PK ^{[1
]}

SLOUGH, G ^{[1
]}

COLEMAN, RV ^{[1
]}

机构：

[1] UNIV VIRGINIA,DEPT PHYS,CHARLOTTESVILLE,VA 22901

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1986年 / 57卷 / 03期

关键词：

D O I：

10.1063/1.1139208

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：441 / 445

页数：5

共 15 条

[1] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].

BINNIG, G ;

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GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123

[2] SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

ROHRER, H .

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[3]

BINNIG G, 1985, B AM PHYS SOC, V30, P251

[4]

BINNIG GK, 1984, SURF SCI, V144, P321, DOI 10.1016/0039-6028(84)90104-3

[5] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[6] CHARGE-DENSITY WAVES OBSERVED WITH A TUNNELING MICROSCOPE [J].

COLEMAN, RV ;

DRAKE, B ;

HANSMA, PK ;

SLOUGH, G .

PHYSICAL REVIEW LETTERS, 1985, 55 (04) :394-397

[7] LOW-TEMPERATURE VACUUM TUNNELING MICROSCOPY [J].

ELROD, SA ;

DELOZANNE, AL ;

QUATE, CF .

APPLIED PHYSICS LETTERS, 1984, 45 (11) :1240-1242

[8]

GOLOVCHENKO JA, 1985, B AM PHYS SOC, V30, P251

[9] AIR AS AN ADJUSTABLE INSULATOR FOR C-V AND G-V ANALYSIS OF SEMICONDUCTOR SURFACES [J].

MORELAND, J ;

DRUCKER, J ;

HANSMA, PK ;

KOTTHAUS, JP ;

ADAMS, A ;

KVAAS, R .

APPLIED PHYSICS LETTERS, 1984, 45 (01) :104-106

[10] ELECTROMAGNETIC SQUEEZER FOR COMPRESSING SQUEEZABLE ELECTRON-TUNNELING JUNCTIONS [J].

MORELAND, J ;

HANSMA, PK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (03) :399-403

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