PEAK SHAPE VARIATION IN FIXED-WAVELENGTH NEUTRON POWDER DIFFRACTION AND ITS EFFECT ON STRUCTURAL PARAMETERS OBTAINED BY RIETVELD ANALYSIS

被引：117

作者：

HILL, RJ ^{[1
]}

HOWARD, CJ ^{[1
]}

机构：

[1] AUSTRALIAN ATOM ENERGY COMMISS,LUCAS HTS RES LABS,LUCAS HTS,NSW 2232,AUSTRALIA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1985年 / 18卷 / JUN期

关键词：

D O I：

10.1107/S0021889885010068

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：173 / 180

页数：8

共 27 条

[1] RUTILE - NORMAL PROBABILITY PLOT ANALYSIS AND ACCURATE MEASUREMENT OF CRYSTAL STRUCTURE
ABRAHAMS, SC
BERNSTEI.JL
[J]. JOURNAL OF CHEMICAL PHYSICS, 1971, 55 (07) : 3206 - &
[2] ANDRESEN AF, 1977, J APPL CRYSTALLOGR, V10, P497
[3] CHOICE OF COLLIMATORS FOR A CRYSTAL SPECTROMETER FOR NEUTRON DIFFRACTION
CAGLIOTI, G
PAOLETTI, A
RICCI, FP
[J]. NUCLEAR INSTRUMENTS & METHODS, 1958, 3 (04): : 223 - 228
[4] PEAK SHAPES AND HALFWIDTHS IN RIETVELD REFINEMENT OF POWDER DIFFRACTION DATA
COX, DE
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C369 - C369
[5] DAVID WIF, 1984, RAL84064 RUTH LAB RE
[6] THE DETERMINATION OF CRYSTALLITE-SIZE AND LATTICE-STRAIN PARAMETERS IN CONJUNCTION WITH THE PROFILE-REFINEMENT METHOD FOR THE DETERMINATION OF CRYSTAL-STRUCTURES
DEKEIJSER, TH
MITTEMEIJER, EJ
ROZENDAAL, HCF
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (JUN) : 309 - 316
[7] USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING
DEKEIJSER, TH
LANGFORD, JI
MITTEMEIJER, EJ
VOGELS, ABP
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) : 308 - 314
[8] X-RAY CHARGE-DENSITY STUDY OF RUTILE (TIO2)
GONSCHOREK, W
[J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1982, 160 (3-4): : 187 - 203
[9] SEPARATION OF PARTICLE SIZE AND LATTICE STRAIN IN INTEGRAL BREADTH MEASUREMENTS
HALDER, NC
WAGNER, CNJ
[J]. ACTA CRYSTALLOGRAPHICA, 1966, 20 : 312 - &
[10] APPROXIMATION OF SYMMETRIC X-RAY PEAKS BY PEARSON TYPE-7 DISTRIBUTIONS
HALL, MM
VEERARAGHAVAN, VG
RUBIN, H
WINCHELL, PG
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) : 66 - 68

← 1 2 3 →