DETERMINATION OF THE ABSORPTION-COEFFICIENT OF A REAL SEMICONDUCTOR FILM - APPLICATION TO ZNSE

被引：10

作者：

PAWLIKOWSKI, JM ^{[1
]}

机构：

[1] UNIV DELAWARE,INST ENERGY CONVERS,NEWARK,DE 19716

来源：

关键词：

D O I：

10.1016/0040-6090(85)90224-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：213 / 220

页数：8

共 11 条

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[2] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE[J]. BENNETT, HE;PORTEUS, JO. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961(02)
[3] BENNETT HE, 1967, PHYS THIN FILMS, V4, P3
[4] CASSET J, 1966, CR ACAD SCI B PHYS, V263, P299
[5] EFFECTS OF SAMPLE IMPERFECTIONS ON OPTICAL-SPECTRA[J]. FILINSKI, I. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1972(02)
[6] A LINEAR-EQUATIONS ALGORITHM FOR REFLECTIVITY EXTRAPOLATION DETERMINATION IN KRAMERS-KRONIG ANALYSIS[J]. JEZIERSKI, K. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984(03)
[7] PAWLIKOWSKI JM, UNPUB THIN SOLID FIL
[8] RELATION BETWEEN HEIGHT DISTRIBUTION OF A ROUGH SURFACE AND REFLECTANCE AT NORMAL INCIDENCE[J]. PORTEUS, JO. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963(12)
[9] AUTOCOVARIANCE FUNCTIONS, ROOT-MEAN-SQUARE-ROUGHNESS HEIGHT, AND AUTOCOVARIANCE LENGTH FOR ROUGH DEPOSITS OF COPPER, SILVER, AND GOLD[J]. RASIGNI, G;VARNIER, F;RASIGNI, M;PALMARI, JP;LLEBARIA, A. PHYSICAL REVIEW B, 1982(04)
[10] AUTOCOVARIANCE FUNCTIONS FOR POLISHED OPTICAL-SURFACES[J]. RASIGNI, G;VARNIER, F;RASIGNI, M;PALMARI, JP. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1983(02)