A NEW THERMAL-OXIDATION METHOD FOR SEMICONDUCTORS-III-V

被引:4
作者
TAKAGI, Y
SUGIURA, O
NARUKE, Y
TAKAHASHI, T
MATSUMURA, M
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1984年 / 23卷 / 07期
关键词
D O I
10.1143/JJAP.23.L490
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:L490 / L492
页数:3
相关论文
共 12 条
[1]   COMPARISON OF GAAS DEVICE APPROACHES FOR ULTRAHIGH-SPEED VLSI [J].
EDEN, RC .
PROCEEDINGS OF THE IEEE, 1982, 70 (01) :5-12
[2]  
FIJISADA H, 1984, JPN J APPL PHYS, V23, pL46
[3]  
FUJIYASU H, 1977, JPN J APPL PHYS, V16, P1473
[4]  
HASEGAWA H, 1981, OYO BUTURI, V12, P1289
[5]   ESCA STUDIES OF CHEMICAL-SHIFTS FOR METAL-OXIDES [J].
HOLM, R ;
STORP, S .
APPLIED PHYSICS, 1976, 9 (03) :217-222
[6]  
KANAZAWA K, 1981, JPN J APPL PHYS, V20, P1107
[7]   COMPOSITION AND STRUCTURE OF THERMAL OXIDES OF INDIUM-PHOSPHIDE [J].
NELSON, A ;
GEIB, K ;
WILMSEN, CW .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (07) :4134-4140
[8]  
Ohno I., 1979, Oyo Buturi, V48, P924
[10]   PHASE-COMPOSITION OF THIN OXIDE-FILMS ON INSB [J].
SMIRNOVA, TP ;
GOLUBENKO, AN ;
ZACHARCHUK, NF ;
BELYI, VI ;
KOKOVIN, GA ;
VALISHEVA, NA .
THIN SOLID FILMS, 1981, 76 (01) :11-21