ASH3 PREEXPOSURE CONDITIONS FOR GAAS EPITAXIAL-GROWTH ON SI BY METALORGANIC CHEMICAL VAPOR-DEPOSITION

被引:3
|
作者
FUJITA, K
SHIBA, Y
YAMAMOTO, T
机构
[1] Advanced Technology Research Laboratories, Sumitomo Metal Industries Ltd., Amagasaki, Hyogo
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 04期
关键词
AsH3; pre-exposure; Crystallinity; GaAs on Si; Growth condition; Metalorganic chemical vapor deposition;
D O I
10.1143/JJAP.29.L534
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effects of AsH3pre-exposure at high temperature on the crystalline quality of GaAs layer grown on Si have been studied using X-ray diffraction. The full width at half-maximum (FWHM) of the (400) reflection from the GaAs layer was affected by the pressure; at 100O°C, the sample with the AsH3pre-exposure at 76 Torr shows narrower FWHM than that with the pre-exposure at 760 Torr. Both samples are analyzed by SIMS. The concentration profile of As and Si around the interface in the sample with lower pressure is sharper than that in the sample with higher pressure. © 1990 IOP Publishing Ltd.
引用
收藏
页码:L534 / L536
页数:3
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