DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS

被引：39
作者：
GUPTA, A
PORTER, WA
LATHROP, JW
机构：
[1] ROCKWELL INT,MICROELECTR DIV,ANAHEIM,CA 91800
[2] TEXAS A&M UNIV,DEPT ELECT ENGN,COLLEGE STN,TX 77843
[3] CLEMSON UNIV,DEPT ELECT & COMP,CLEMSON,SC 29631
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1974年 / SC 9卷 / 03期
关键词：
D O I：
10.1109/JSSC.1974.1050475
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：96 / 103
页数：8
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