DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS

被引：39

作者：

GUPTA, A

PORTER, WA

LATHROP, JW

机构：

[1] ROCKWELL INT,MICROELECTR DIV,ANAHEIM,CA 91800

[2] TEXAS A&M UNIV,DEPT ELECT ENGN,COLLEGE STN,TX 77843

[3] CLEMSON UNIV,DEPT ELECT & COMP,CLEMSON,SC 29631

来源：

关键词：

D O I：

10.1109/JSSC.1974.1050475

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：96 / 103

页数：8

共 50 条

[21] EFFECT OF STATISTICAL AND SYSTEMATIC FAILURES ON THE PROCESS YIELD OF INTEGRATED-CIRCUITS
HILBERG, W
FREQUENZ, 1979, 33 (11) : 320 - 326
[22] AN EFFICIENT METHOD FOR PARAMETRIC YIELD OPTIMIZATION OF MOS INTEGRATED-CIRCUITS
YU, TK
KANG, SM
SACKS, J
WELCH, WJ
1989 IEEE INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN: DIGEST OF TECHNICAL PAPERS, 1989, : 190 - 193
[23] SOCKETS FOR INTEGRATED-CIRCUITS
GREENFIELD, D
ELECTRONICS AND POWER, 1983, 29 (05): : 409 - 411
[24] SPYING ON INTEGRATED-CIRCUITS
ANCEAU, F
RECHERCHE, 1981, 12 (123): : 760 - 761
[25] OPTOELECTRONIC INTEGRATED-CIRCUITS
FORREST, SR
PROCEEDINGS OF THE IEEE, 1987, 75 (11) : 1488 - 1497
[26] OPTOELECTRONIC INTEGRATED-CIRCUITS
WILLIAMS, PJ
CARTER, AC
GEC JOURNAL OF RESEARCH, 1993, 10 (02): : 91 - 95
[27] INTEGRATED-CIRCUITS FOR TELEPHONY
GRAY, PR
MESSERSCHMITT, DG
PROCEEDINGS OF THE IEEE, 1980, 68 (08) : 991 - 1009
[28] LINEAR INTEGRATED-CIRCUITS
HUFFMAN, G
EDN MAGAZINE-ELECTRICAL DESIGN NEWS, 1980, 25 (04): : 96 - 103
[29] ENCAPSULATING INTEGRATED-CIRCUITS
WHITE, ML
BELL LABORATORIES RECORD, 1974, 52 (03): : 78 - 83
[30] NEW INTEGRATED-CIRCUITS
STEIN, KU
SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1979, 8 (05): : 249 - 250