DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS

被引：39
作者：
GUPTA, A
PORTER, WA
LATHROP, JW
机构：
[1] ROCKWELL INT,MICROELECTR DIV,ANAHEIM,CA 91800
[2] TEXAS A&M UNIV,DEPT ELECT ENGN,COLLEGE STN,TX 77843
[3] CLEMSON UNIV,DEPT ELECT & COMP,CLEMSON,SC 29631
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1974年 / SC 9卷 / 03期
关键词：
D O I：
10.1109/JSSC.1974.1050475
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：96 / 103
页数：8
相关论文
共 50 条
[21]   EFFECT OF STATISTICAL AND SYSTEMATIC FAILURES ON THE PROCESS YIELD OF INTEGRATED-CIRCUITS [J].
HILBERG, W .
FREQUENZ, 1979, 33 (11) :320-326
[22]   AN EFFICIENT METHOD FOR PARAMETRIC YIELD OPTIMIZATION OF MOS INTEGRATED-CIRCUITS [J].
YU, TK ;
KANG, SM ;
SACKS, J ;
WELCH, WJ .
1989 IEEE INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN: DIGEST OF TECHNICAL PAPERS, 1989, :190-193
[23]   INTEGRATED-CIRCUITS FOR TELEPHONY [J].
GRAY, PR ;
MESSERSCHMITT, DG .
PROCEEDINGS OF THE IEEE, 1980, 68 (08) :991-1009
[24]   OPTOELECTRONIC INTEGRATED-CIRCUITS [J].
FORREST, SR .
PROCEEDINGS OF THE IEEE, 1987, 75 (11) :1488-1497
[25]   OPTOELECTRONIC INTEGRATED-CIRCUITS [J].
WILLIAMS, PJ ;
CARTER, AC .
GEC JOURNAL OF RESEARCH, 1993, 10 (02) :91-95
[26]   LINEAR INTEGRATED-CIRCUITS [J].
HUFFMAN, G .
EDN MAGAZINE-ELECTRICAL DESIGN NEWS, 1980, 25 (04) :96-103
[27]   INTEGRATED-CIRCUITS IN UK [J].
不详 .
WIRELESS WORLD, 1973, 79 (1457) :523-523
[28]   QUALIFICATION OF INTEGRATED-CIRCUITS [J].
WURNIK, F .
MICROELECTRONICS AND RELIABILITY, 1986, 26 (04) :665-677
[29]   LOGIC INTEGRATED-CIRCUITS [J].
MURRAY, J .
ENGINEERING, 1975, 215 (09) :R1-R8
[30]   SOCKETS FOR INTEGRATED-CIRCUITS [J].
GREENFIELD, D .
ELECTRONICS AND POWER, 1983, 29 (05) :409-411
12345