LOWER LIMIT OF THE THICKNESS OF THE MEASURABLE SURFACE-LAYER BY FOURIER-TRANSFORM INFRARED ATTENUATED TOTAL REFLECTION SPECTROMETRY

被引：37
作者：
OHTA, K [1 ]
IWAMOTO, R [1 ]
机构：
[1] GOVT IND RES INST,MIDORIGAOKA 1,IKEDA,OSAKA 563,JAPAN
来源：
ANALYTICAL CHEMISTRY | 1985年 / 57卷 / 13期
关键词：
D O I：
10.1021/ac00290a015
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：2491 / 2499
页数：9
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