PHOTOLUMINESCENCE AND OPTICAL BEAM INDUCED CURRENT IMAGES OF DEFECTS IN SEMICONDUCTORS

被引：4
作者：
WILSON, T
MCCABE, EM
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1987年 / 103卷 / 01期
关键词：
D O I：
10.1002/pssa.2211030111
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：107 / 113
页数：7
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