TOPOGRAPHICAL LIMITATIONS TO THE METALLIZATION OF VERY LARGE-SCALE INTEGRATED STRUCTURES BY BIAS SPUTTERING - EXPERIMENTS AND COMPUTER-SIMULATIONS

被引:9
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作者
BADER, HP
LARDON, MA
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10.1116/1.583482
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:1192 / 1194
页数:3
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