共 22 条
- [21] EFFECTS OF ALUMINUM-SILICON COPPER SPUTTERING TARGET PROCESSING METHODS ON THIN-FILM UNIFORMITY AND PROCESS-CONTROL DURING VERY LARGE-SCALE INTEGRATED DEVICE FABRICATION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (04): : 1558 - 1565
- [22] Pattern matching between a scanning electron microscopy exposed pattern image of large-scale integrated fine structures and computer-aided design layout data by using the relaxation method JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06): : 3065 - 3068