DISTORTION OF THE ZEROTH-ORDER LAUE-ZONE PATTERN CAUSED BY DISLOCATIONS IN A SILICON CRYSTAL

被引：15

作者：

WEN, JG

WANG, RH

LU, GH

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1989年 / 45卷

关键词：

D O I：

10.1107/S0108767389001285

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：422 / 427

页数：6

共 10 条

[1] BIAN WM, 1986, J CHIN ELECTRON MICR, V5, P46
[2] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
CARPENTER, RW
SPENCE, JCH
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &
[3] ELECTRON-DIFFRACTION STUDIES OF STRAIN IN EPITAXIAL BICRYSTALS AND MULTILAYERS
CHERNS, D
KIELY, CJ
PRESTON, AR
[J]. ULTRAMICROSCOPY, 1988, 24 (04) : 355 - 370
[4] CHERNS D, 1986, 11TH P INT C EL MICR, P721
[5] CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF TRANSVERSE STACKING-FAULTS AND DISLOCATIONS
FUNG, KK
[J]. ULTRAMICROSCOPY, 1985, 17 (02) : 81 - 85
[6] HIRSCH P, 1977, ELECTRON MICROS, P265
[7] HULL D, 1984, INTRO DISLOCATIONS, P18
[8] TANAKA M, 1986, J ELECTRON MICROSC, V35, P314
[9] TANAKA M, 1980, J ELECTRON MICROSC, V29, P408
[10] TANAKA M, 1988, CONVERGENT BEAM ELEC, V2, P160