PRECISE DETERMINATION OF RELATIVE ORIENTATION OF 2 CRYSTALS FROM ANALYSIS OF SPOT DIFFRACTION PATTERNS

被引：11
作者：
BONNET, R
LAUFER, EE
机构：
[1] CANADA CTR MINERAL & ENERGY TECHNOL,PHYS MET RES LABS,OTTAWA K1A OG1,ONTARIO,CANADA
[2] ECOLE NATL SUPER ELECTROCHIM & ELECTROMET GRENOBLE,LTPCM,F-38401 ST MARTIN HERES,FRANCE
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1977年 / 40卷 / 02期
关键词：
D O I：
10.1002/pssa.2210400227
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：599 / 603
页数：5
相关论文
共 8 条
  • [1] Bollman W., 1970, CRYSTAL DEFECTS CRYS
  • [2] PRECISE DETERMINATION OF RELATIVE ORIENTATION OF 2 CRYSTALS FROM ANALYSIS OF 2 KIKUCHI PATTERNS
    BONNET, R
    DURAND, F
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 27 (02): : 543 - 549
  • [3] BONNET R, 1976, 3 P ANN M MICR SOC C
  • [4] DEMING WE, 1943, STATISTICAL ADJUSTME, P50
  • [5] HIRSCH PB, 1965, ELECTRON MICROSCOPY
  • [6] Jubb J. T., 1976, Journal of Physics E (Scientific Instruments), V9, P871, DOI 10.1088/0022-3735/9/10/025
  • [7] USE OF BEAM TILT CIRCUITRY OF AN ELECTRON-MICROSCOPE FOR RAPID-DETERMINATION OF LATTICE-CONSTANTS
    LAUFER, EE
    JUBB, JT
    MILLIKEN, KS
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (08): : 671 - 675
  • [8] MILLIKEN KS, COMMUNICATION
1