TERMINAL-ORIENTED MODEL FOR MERGED TRANSISTOR LOGIC (MTL)

被引:38
作者
BERGER, HH [1 ]
WIEDMANN, SK [1 ]
机构
[1] IBM LABS,BOEBLINGEN,WEST GERMANY
关键词
D O I
10.1109/JSSC.1974.1050505
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:211 / 217
页数:7
相关论文
共 10 条
[1]   TRANSIENT ANALYSIS AND DEVICE CHARACTERIZATION OF ACP CIRCUITS [J].
ASHAR, KG ;
GHOSH, HN ;
ALDRIDGE, AW ;
PATTERSON, LJ .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1963, 7 (03) :207-223
[2]  
BERGER HH, 1974, IEEE J SOLID STATE C, VSC 9, P218
[3]  
BERGER HH, 1972, IEEE J SOLID STATE C, VSC 7, P340
[4]  
BERGER HH, 1973, Patent No. 3736477
[5]   LARGE-SIGNAL BEHAVIOR OF JUNCTION TRANSISTORS [J].
EBERS, JJ ;
MOLL, JL .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (12) :1761-1772
[6]  
HART K, 1972, IEEE J SOLID STATE C, VSC 7, P346
[7]  
LECAN C, 1962, SWITCHING DEVICES DI
[8]  
LIN HC, 1969, IEEE J SOLID STATE C, VSC 4, P20
[9]  
LYNN DK, 1967, ANALYSIS DESIGN INTE, P75
[10]  
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