共 4 条
[1]
A NEW VUV-REFLECTOMETER FOR UHV-APPLICATIONS
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1983, 208 (1-3)
:415-418
[2]
ON CAUSE OF ERRORS IN REFLECTANCE VS ANGLE OF INCIDENCE MEASUREMENTS AND DESIGN OF REFLECTOMETERS TO ELIMINATE ERRORS
[J].
APPLIED OPTICS,
1967, 6 (12)
:2140-&
[3]
A GRATING CRYSTAL MONOCHROMATOR FOR THE SPECTRAL RANGE 5 EV TO 5 KEV
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH,
1982, 195 (1-2)
:141-153