PHOTOELECTRON EMISSION MICROSCOPY OF WORK FUNCTION CHANGES

被引：35
作者：
BETHGE, H
KLAUA, M
机构：
来源：
ULTRAMICROSCOPY | 1983年 / 11卷 / 2-3期
关键词：
D O I：
10.1016/0304-3991(83)90238-3
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：207 / 213
页数：7
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