共 4 条
[1]
KINO GS, 1972, 1972 ULTR S P
[2]
SI-SIO2 INTERFACE - ELECTRICAL PROPERTIES AS DETERMINED BY METAL-INSULATOR-SILICON CONDUCTANCE TECHNIQUE
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1967, 46 (06)
:1055-+
[3]
WANG WC, 1972, 1972 ULTR S P, P316
[4]
YAMANISHI M, 1972, 1972 P IEEE ULTR S, P288