MEASUREMENTS OF THE NONLINEAR DAMPING FACTOR IN 1.5 MU-M DISTRIBUTED FEEDBACK LASERS

被引:19
作者
TSUJI, S [1 ]
VODHANEL, RS [1 ]
CHOY, MM [1 ]
机构
[1] BELL COMMUN RES,RED BANK,NJ 07701
关键词
D O I
10.1063/1.101225
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:90 / 92
页数:3
相关论文
共 16 条
[1]   HIGH-FREQUENCY MODULATION OF 1.52 MU-M VAPOR-PHASE-TRANSPORTED INGAASP LASERS [J].
BOWERS, JE ;
KOCH, TL ;
HEMENWAY, BR ;
WILT, DP ;
BRIDGES, TJ ;
BURKHARDT, EG .
ELECTRONICS LETTERS, 1985, 21 (09) :392-393
[2]   HIGH-SPEED INGAASP CONSTRICTED-MESA LASERS [J].
BOWERS, JE ;
HEMENWAY, BR ;
GNAUCK, AH ;
WILT, DP .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (06) :833-844
[3]   EFFECT OF GAIN SATURATION ON INJECTION-LASER SWITCHING [J].
CHANNIN, DJ .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (06) :3858-3860
[4]   LIGHTWAVE SYSTEM USING MICROWAVE SUBCARRIER MULTIPLEXING [J].
DARCIE, TE ;
DIXON, ME ;
KASPER, BL ;
BURRUS, CA .
ELECTRONICS LETTERS, 1986, 22 (15) :774-775
[5]   REDUCTION OF RESONANCE-LIKE PEAK IN DIRECT MODULATION DUE TO CARRIER DIFFUSION IN INJECTION-LASER [J].
FURUYA, K ;
SUEMATSU, Y ;
HONG, T .
APPLIED OPTICS, 1978, 17 (12) :1949-1952
[6]   MEASUREMENT OF FM NOISE, AM NOISE, AND FIELD SPECTRA OF 1.3-MU-M INGAASP DFB LASERS AND DETERMINATION OF THE LINEWIDTH ENHANCEMENT FACTOR [J].
KIKUCHI, K ;
OKOSHI, T .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1985, 21 (11) :1814-1818
[7]   EFFECT OF NONLINEAR GAIN REDUCTION ON SEMICONDUCTOR-LASER WAVELENGTH CHIRPING [J].
KOCH, TL ;
LINKE, RA .
APPLIED PHYSICS LETTERS, 1986, 48 (10) :613-615
[8]   PARASITIC-FREE MEASUREMENT OF THE FUNDAMENTAL-FREQUENCY RESPONSE OF A SEMICONDUCTOR-LASER BY ACTIVE-LAYER PHOTOMIXING [J].
NEWKIRK, MA ;
VAHALA, KJ .
APPLIED PHYSICS LETTERS, 1988, 52 (10) :770-772
[9]   FREQUENCY-RESPONSE OF 1.3-MU-M INGAASP HIGH-SPEED SEMICONDUCTOR-LASERS [J].
OLSHANSKY, R ;
HILL, P ;
LANZISERA, V ;
POWAZINIK, W .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1987, 23 (09) :1410-1418
[10]   MEASUREMENT OF NONLINEAR GAIN FROM FM MODULATION INDEX OF INGAASP LASERS [J].
SU, CB ;
LANZISERA, V ;
OLSHANSKY, R .
ELECTRONICS LETTERS, 1985, 21 (20) :893-895