DEGRADATION MECHANISM IN SI-DOPED AL/SI CONTACTS AND AN EXTREMELY STABLE METALLIZATION SYSTEM

被引:14
作者
MORI, M
KANAMORI, S
UEKI, T
机构
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1983年 / 6卷 / 02期
关键词
D O I
10.1109/TCHMT.1983.1136163
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:159 / 162
页数:4
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