SINGLE ATOM IMAGE-CONTRAST - CONVENTIONAL DARK-FIELD AND BRIGHT-FIELD ELECTRON-MICROSCOPY

被引：17
作者：
CHIU, W
GLAESER, RM
机构：
[1] UNIV CALIF,LAWRENCE BERKELEY LAB,DIV MED PHYS,BERKELEY,CA 94720
[2] UNIV CALIF,LAWRENCE BERKELEY LAB,DONNER LAB,BERKELEY,CA 94720
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1975年 / 103卷 / JAN期
关键词：
D O I：
10.1111/j.1365-2818.1975.tb04535.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：33 / 54
页数：22
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