SINGLE ATOM IMAGE-CONTRAST - CONVENTIONAL DARK-FIELD AND BRIGHT-FIELD ELECTRON-MICROSCOPY

被引：17

作者：

CHIU, W

GLAESER, RM

机构：

[1] UNIV CALIF,LAWRENCE BERKELEY LAB,DIV MED PHYS,BERKELEY,CA 94720

[2] UNIV CALIF,LAWRENCE BERKELEY LAB,DONNER LAB,BERKELEY,CA 94720

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1975年 / 103卷 / JAN期

关键词：

D O I：

10.1111/j.1365-2818.1975.tb04535.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：33 / 54

页数：22

共 24 条

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[4] CREWE AV, 1972, 5 P EUR C EL MICR MA, P640
[5] IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST
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SIEGEL, BM
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[6] STUDY ON HEAVY/LIGHT ATOM DISCRIMINATION IN BRIGHT-FIELD ELECTRON-MICROSCOPY USING COMPUTER
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[J]. BIOPHYSICAL JOURNAL, 1972, 12 (05) : 484 - &
[7] GLAESER RM, 1975, ELECTRON MICROSCOPY
[8] ELECTRON MICROSCOPE CONTRAST OF SMALL ATOM CLUSTERS
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HINES, RL
[J]. PHILOSOPHICAL MAGAZINE, 1970, 21 (174): : 1175 - &
[9] HASHIMOTO H, 1973, J ELECTRON MICROSC, V22, P123
[10] HASHIMOTO H, 1972, 30 P ANN M EL MICR S, P554