HIGH-RESOLUTION UHV ELECTRON-MICROSCOPY OF SURFACE-STRUCTURES

被引：0
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作者：
TAKAYANAGI, K [1 ]
机构：
[1] TOKYO INST TECHNOL,MEGURO KU,TOKYO 152,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1988年 / 37卷 / 02期
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中图分类号：
TH742 [显微镜];
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页码：93 / 93
页数：1
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