BROAD-BAND PERMITTIVITY MEASUREMENTS USING THE SEMI-AUTOMATIC NETWORK ANALYZER

[1] COBB GR, 1981, MICROWAVE SYST NEWS, V2, P27

[2] Collin R. E., 1990, FIELD THEORY GUIDED, V5, DOI 10.1109/9780470544648

[3] TECHNIQUES FOR MEASUREMENT OF COMPLEX MICROWAVE CONDUCTIVITY AND ASSOCIATED ERRORS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (03) : 162 - &

[4] EXCESS LOSSES IN H-PLANE LOADED WAVEGUIDES [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (07) : 457 - 461

[5] Ness J. B., 1983, IREECON International Sydney 83. 19th International Electronics Convention and Exhibition. Digest of Papers, P330

[6] STUCHLY SS, 1972, J MICROWAVE POWER, V7, P124

[7] SUCHER M, 1963, HDB MICROWAVE MEASUR, V2, pCH9

[8] VONHIPPEL A, 1954, DIELECTRIC MATERIALS, pCH2

[1] COBB GR, 1981, MICROWAVE SYST NEWS, V2, P27

[2] Collin R. E., 1990, FIELD THEORY GUIDED, V5, DOI 10.1109/9780470544648

[3] TECHNIQUES FOR MEASUREMENT OF COMPLEX MICROWAVE CONDUCTIVITY AND ASSOCIATED ERRORS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (03) : 162 - &

[4] EXCESS LOSSES IN H-PLANE LOADED WAVEGUIDES [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (07) : 457 - 461

[5] Ness J. B., 1983, IREECON International Sydney 83. 19th International Electronics Convention and Exhibition. Digest of Papers, P330

[6] STUCHLY SS, 1972, J MICROWAVE POWER, V7, P124

[7] SUCHER M, 1963, HDB MICROWAVE MEASUR, V2, pCH9

[8] VONHIPPEL A, 1954, DIELECTRIC MATERIALS, pCH2