ELECTROREFLECTANCE SPECTROSCOPY OF SI-GEXSI1-X QUANTUM-WELL STRUCTURES

被引：92
作者：
PEARSALL, TP
POLLAK, FH
BEAN, JC
HULL, R
机构：
[1] CUNY BROOKLYN COLL,DEPT PHYS,BROOKLYN,NY 11210
[2] POLYTECH UNIV,CTR ADV TECHNOL TELECOMMUN,BROOKLYN,NY 11201
来源：
PHYSICAL REVIEW B | 1986年 / 33卷 / 10期
关键词：
D O I：
10.1103/PhysRevB.33.6821
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：6821 / 6830
页数：10
相关论文
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